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These pages are intended to provide an overview of recent research
in semiconductor test and related topics. They include collaborative
research funded by the European Union within the Framework
Programmes along with individual national government and industrial
funded programmes. The research database is under continual
development, so if you are aware of research programmes we have not
yet included then please let us know. Please click the project
acronym for more information.
Index:
|
Project end date |
Funding organisation |
Title |
Acronym |
| July 2004 |
Europe |
Testability of Analog Macrocells Embedded into
System-on-Chip |
TAMES-2 |
| May-2004 |
Europe |
Formal Verification in SYsteM Level Based Design |
SYMBAD |
| Feb-2003 |
Europe |
Advanced reliability qualification and monitoring equipment
assessment |
MIDAS |
| Aug-2003 |
Europe |
European Network for Initial and Continuing Education in
VLSI/SOC Testing using remote ATE facilities |
EUNICE-TEST |
| Aug- 2004 |
Europe |
Integrated Design Methodology for enhANced Device Robustness |
DEMAND |
| Sep- 2002 |
Europe |
Development and Applications of New Built-in-Test Software
Components in European Industries |
COMPONENT+ |
| June- 2006 |
Europe |
MHP Conformance Testing Improvement by
Development of New Conformance Tests in Europe |
MHP-CONFIDENCE |
| Dec- 2007 |
Europe |
European Network for Coordination of
Advanced System Integration Technologies |
ENCASIT |
| June- 2006 |
Europe |
CMOS backbone for 2010 e-Europe NANOCMOS
From the 45 nm node down to the limits |
NANOCMOS |
| Dec- 2008 |
Europe |
Multipurpose Dynamically Reconfigurable
Platform for Intensive and Flexible Hetereogeneous
Processing: A technology breakthrough for Embedded Computing |
MORPHEUS |
| Feb-2009 |
Europe |
Wireless Sensor Networks with
Self-Organization Capabilities for Critical and Emergency
Applications |
WINSOC |
| Nov- 2008 |
Europe |
Verification and Validation of Embedded
System Design Workbench that is how to make sure that
systems controlled by intelligent electronic chips will
satisfy certain safety conditions |
VERTIGO |
| Aug- 2009 |
Europe |
EvoTest - evolutionary testing for complex
systems |
EVOTEST |
| Aug- 2009 |
Europe |
European Network for Co-ordination of
Advanced Semiconductor Technologies |
ENCAST |
| Sep- 2008 |
UK (EPSRC) |
Advanced modelling and
simulation of smart power ICs and packages for operation at
225 C in automotive Electronics |
ADAM-SPICE |
| Nov- 2010 |
UK (EPSRC) |
Meeting the design challenges of the
nano-CMOS electronics |
nano-CMOS |
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