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The Semiconductor Test Network |
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Latest Semiconductor Test News
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The International Technology Roadmap for Semiconductors, last revised revised in 2006, predicts many challenges in the area of Test over the coming years. Not only are the complexity and unpredictability of electronics components and systems increasing, so too are the environmental extremities in which electronics is expected to work to life critical reliability levels. Passive component reliability is equally important and there is
considerable international research being carried out on materials
technology and passive component testing.
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A note on funding: Initial funding for SETNET was provided by EPSRC. We are now dependant on our sponsors and advertisers FEATURED: LOCHITT - Low cost test system for High Temperature Electronics
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